IEEE - Institute of Electrical and Electronics Engineers, Inc. - The good, the bad, and the ugly of silicon debug

2006 Design Automation Conference

Author(s): D. Josephson
Sponsor(s): SiCda
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: San Francisco, CA, USA
Conference Date: 24 July 2006
Page(s): 3 - 6
ISBN (Paper): 1-59593-381-6
ISSN (Paper): 0738-100X
DOI: 10.1145/1146909.1146915
Regular:

Silicon debug begins with the arrival of design prototypes and can continue well after a product has gone into production. It is perhaps the most exciting and challenging stage of the integrated... View More

Advertisement