IEEE - Institute of Electrical and Electronics Engineers, Inc. - Panel: how will the fabless model survive?

2006 Design Automation Conference

Author(s): D. Clark ; R. Radojcic ; T. Hartung ; A. Hunter ; F. James ; M. Bohr ; B. Paulsen ; N. Yu
Sponsor(s): SiCda
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: San Francisco, CA, USA
Conference Date: 24 July 2006
Page(s): 1 - 2
ISBN (Paper): 1-59593-381-6
ISSN (Paper): 0738-100X
DOI: 10.1109/DAC.2006.238682
Regular:

The fabless model was traditionally enabled through clean interfaces oth in technical and business terms - between foundries and fabless semiconductor companies. However, with advanced... View More

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