IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Memetic Algorithm for Multi-Criteria Sequencing Problem for a Mixed-Model Assembly Line in a JIT Production System

2006 IEEE Congress on Evolutionary Computation

Author(s): R. Tavakkoli-Moghaddam ; A.R. Rahimi-Vahed
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Vancouver, BC, Canada
Conference Date: 16 July 2006
Page(s): 2,993 - 2,998
ISBN (Paper): 0-7803-9487-9
DOI: 10.1109/CEC.2006.1688686
Regular:

This paper presents a new mathematical model of mixed-model assembly lines (MMAL) to find the best sequences of product models in a just-in-time (JIT) production system. The objective is to... View More

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