IEEE - Institute of Electrical and Electronics Engineers, Inc. - Atmospheric electron-induced X-ray spectrometer development

2006 IEEE Aerospace Conference

Author(s): J.Z. Wilcox ; E. Urgiles ; R. Toda ; J. Crisp
Sponsor(s): Aerospace and Electron. Syst. Soc
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Big Sky, MT, USA
Conference Date: 4 March 2006
ISBN (Paper): 0-7803-9545-X
DOI: 10.1109/AERO.2006.1655755
Regular:

The progress in the development of the atmospheric electron X-ray spectrometer (AEXS) is described. The AEXS is a surface analysis tool based on excitation of characteristic X-ray fluorescence... View More

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