IEEE - Institute of Electrical and Electronics Engineers, Inc. - Trend in DRAM soft errors

12th IEEE International On-Line Testing Symposium

Author(s): G. Schindlbeck
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Lake Como, Italy
Conference Date: 10 July 2006
ISBN (Paper): 0-7695-2620-9
DOI: 10.1109/IOLTS.2006.63
Regular:

Summary form only given. The quality of electrical tests during irradiation of components has also improved a lot. Test patterns have been modified and characteristics of recent DRAMs have had to... View More

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