IEEE - Institute of Electrical and Electronics Engineers, Inc. - The problem of on-line testing methods in approximate data processing

12th IEEE International On-Line Testing Symposium

Author(s): A. Drozd ; M. Lobachev ; J. Drozd
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Lake Como, Italy
Conference Date: 10 July 2006
ISBN (Paper): 0-7695-2620-9
DOI: 10.1109/IOLTS.2006.61
Regular:

This paper is devoted to the on-line testing methods based on the self-checking techniques. These methods are aimed to estimate the reliability of a result calculated at the output of the circuit... View More

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