IEEE - Institute of Electrical and Electronics Engineers, Inc. - Contribution of communications to dependability in massively-defective general-purpose nanoarchitectures

12th IEEE International On-Line Testing Symposium

Author(s): J.H. Collet ; P. Zajac ; Y. Crouzet ; A. Napieralski
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Lake Como, Italy
Conference Date: 10 July 2006
ISBN (Paper): 0-7695-2620-9
DOI: 10.1109/IOLTS.2006.18
Regular:

Many previous studies have analyzed the issues of dependability in the physical layers of future nanoarchitectures. Here we consider the upper layers and especially the contribution of... View More

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