IEEE - Institute of Electrical and Electronics Engineers, Inc. - Localization of faults in radix-n signed digit adders

12th IEEE International On-Line Testing Symposium

Author(s): G.C. Cardarilli ; M. Ottavi ; S. Pontarelli ; M. Re ; A. Salsano
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Lake Como, Italy
Conference Date: 10 July 2006
ISBN (Paper): 0-7695-2620-9
DOI: 10.1109/IOLTS.2006.42
Regular:

It is widely known that an adder can be checked by using check symbols that are residues of the numbers modulo some base. This paper extends this characteristic to a radix r signed digit (SD)... View More

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