IEEE - Institute of Electrical and Electronics Engineers, Inc. - Evaluating one-hot encoding finite state machines for SEU reliability in SRAM-based FPGAs

12th IEEE International On-Line Testing Symposium

Author(s): M. Cassel ; F. Lima
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Lake Como, Italy
Conference Date: 10 July 2006
ISBN (Paper): 0-7695-2620-9
DOI: 10.1109/IOLTS.2006.32
Regular:

This work discusses the use of two fault-tolerant techniques, duplication with self-checking and triple modular redundancy, for one-hot encoding FSM in SRAM-based techniques. The FSM encoding... View More

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