IEEE - Institute of Electrical and Electronics Engineers, Inc. - Secure scan techniques: a comparison

12th IEEE International On-Line Testing Symposium

Author(s): D. Hely ; F. Bancel ; M.-L. Flottes ; B. Rouzeyre
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Lake Como, Italy
Conference Date: 10 July 2006
ISBN (Paper): 0-7695-2620-9
DOI: 10.1109/IOLTS.2006.55
Regular:

Designing secure ICs requires fulfilling many design rules in order to protect access to secret data. However, these security design requirements may be in opposition to test needs and testability... View More

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