IEEE - Institute of Electrical and Electronics Engineers, Inc. - Asynchronous design: fault robustness and security characteristics

12th IEEE International On-Line Testing Symposium

Author(s): M. Renaudin ; Y. Monnet
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Lake Como, Italy
Conference Date: 10 July 2006
ISBN (Paper): 0-7695-2620-9
DOI: 10.1109/IOLTS.2006.11
Regular:

The problem of fault tolerance and fault resistance is becoming more and more important in all application fields. In this context, asynchronous designs provide inherent properties that make them... View More

Advertisement