IEEE - Institute of Electrical and Electronics Engineers, Inc. - From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately?

12th IEEE International On-Line Testing Symposium

Author(s): L. Anghel ; M. Nicolaidis ; N. Buard
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Lake Como, Italy
Conference Date: 10 July 2006
Page(s): 85
ISBN (Paper): 0-7695-2620-9
DOI: 10.1109/IOLTS.2006.40
Regular:

This panel will bring together a set of experts working in a collaborative project to address at both experimental measurement and simulations all levels of the process leading to system failures... View More

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