IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability issues for embedded SRAM at 90nm and below

12th IEEE International On-Line Testing Symposium

Author(s): R. Aitken
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Lake Como, Italy
Conference Date: 10 July 2006
ISBN (Paper): 0-7695-2620-9
DOI: 10.1109/IOLTS.2006.54
Regular:

Summary form only given. With ever-shrinking process technology, there is significant concern about the effects of process variability on design margins, yield, and performance. In addition,... View More

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