IEEE - Institute of Electrical and Electronics Engineers, Inc. - Efficient deterministic test generation for BIST schemes with LFSR reseeding

12th IEEE International On-Line Testing Symposium

Author(s): S. Neophytou ; M.K. Michael ; S. Tragoudas
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Lake Como, Italy
Conference Date: 10 July 2006
ISBN (Paper): 0-7695-2620-9
DOI: 10.1109/IOLTS.2006.26
Regular:

We propose a novel method for generating test patterns that can be encoded efficiently using reseeding of LFSR-based schemes for hybrid BIST. Our focus is to reduce the number of deterministic... View More

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