IEEE - Institute of Electrical and Electronics Engineers, Inc. - Delay fault localization in test-per-scan BIST using built-in delay sensor

12th IEEE International On-Line Testing Symposium

Author(s): S. Ghosh ; S. Bhunia ; A. Raychowdhury ; K. Roy
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Lake Como, Italy
Conference Date: 10 July 2006
ISBN (Paper): 0-7695-2620-9
DOI: 10.1109/IOLTS.2006.19
Regular:

Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. However, the increasing... View More

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