IEEE - Institute of Electrical and Electronics Engineers, Inc. - Diagnosis of dense-time systems using digital-clocks

2006 American Control Conference

Author(s): Shengbing Jiang ; R. Kumar
Sponsor(s): American Automatic Control Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Minneapolis, MN, USA
Conference Date: 14 June 2006
Page Count: 6
ISBN (Paper): 1-4244-0209-3
ISBN (Online): 1-4244-0210-7
DOI: 10.1109/ACC.2006.1657691
Regular:

We study failure diagnosis of timed discrete-event systems modeled as dense timed-automata for which reachability is decidable (Alur, 1999; Henzinger et al., 1994). Failure diagnosis of such... View More

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