IEEE - Institute of Electrical and Electronics Engineers, Inc. - Light charged particle classification using subspace identification methods and neural networks

2006 American Control Conference

Author(s): F. Previdi ; S.M. Savaresi ; P. Guazzoni ; L. Zetta
Sponsor(s): American Automatic Control Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Minneapolis, MN, USA
Conference Date: 14 June 2006
Page Count: 6
ISBN (Paper): 1-4244-0209-3
ISBN (Online): 1-4244-0210-7
DOI: 10.1109/ACC.2006.1657190
Regular:

The problem considered in this work is the classification of the particles produced by the collision of a heavy ion beam over a target. Each particle is captured by a detector, and results in a... View More

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