IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault isolability conditions for linear systems with additive faults

2006 American Control Conference

Author(s): J. Stoustrup ; H. Niemann
Sponsor(s): American Automatic Control Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Minneapolis, MN, USA
Conference Date: 14 June 2006
Page Count: 6
ISBN (Paper): 1-4244-0209-3
ISBN (Online): 1-4244-0210-7
DOI: 10.1109/ACC.2006.1656570
Regular:

In this paper, we shall show that an unlimited number of additive single faults can be isolated under mild conditions if a general isolation scheme is applied. Multiple faults are also covered.... View More

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