IEEE - Institute of Electrical and Electronics Engineers, Inc. - Enhanced performance in contact mode atomic force microscopy

2006 American Control Conference

Author(s): Zhichong Li ; E. Lee ; F.B. Amara
Sponsor(s): American Automatic Control Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Minneapolis, MN, USA
Conference Date: 14 June 2006
Page Count: 6
ISBN (Paper): 1-4244-0209-3
ISBN (Online): 1-4244-0210-7
DOI: 10.1109/ACC.2006.1655410
Regular:

Atomic force microscopy (AFM) had and continues to have a substantial impact on nanosciences and technologies. However, the low scanning speed continues to be one of the obstacles that impede the... View More

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