IEEE - Institute of Electrical and Electronics Engineers, Inc. - An algorithm for boundary tracking in AFM

2006 American Control Conference

Author(s): S.B. Andersson
Sponsor(s): American Automatic Control Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Minneapolis, MN, USA
Conference Date: 14 June 2006
Page Count: 6
ISBN (Paper): 1-4244-0209-3
ISBN (Online): 1-4244-0210-7
DOI: 10.1109/ACC.2006.1655407
Regular:

The standard approach to investigating dynamic phenomena in atomic force microscopy (AFM) is through the use of time-lapse imaging techniques. Because the time to acquire each image is often on... View More

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