IEEE - Institute of Electrical and Electronics Engineers, Inc. - New on-Chip DFT and ATE Features for Efficient Embedded Memory Test

2006 EEE International Workshop on Memory Technology, Design and Testing

Author(s): P. Muhmenthaler
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Taipei, Taiwan
Conference Date: 2 August 2006
ISBN (Paper): 0-7695-2572-5
ISSN (Paper): 1087-4852
DOI: 10.1109/MTDT.2006.20
Regular:

Testing of embedded memories, independent whether it is of volatile or non-volatile type, is based on various kinds of built-in self-test. This test solution is often driven by the fact that the... View More

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