IEEE - Institute of Electrical and Electronics Engineers, Inc. - DRAM Industry Trend

2006 EEE International Workshop on Memory Technology, Design and Testing

Author(s): Pei-Lin Pai
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Taipei, Taiwan
Conference Date: 2 August 2006
ISBN (Paper): 0-7695-2572-5
ISSN (Paper): 1087-4852
DOI: 10.1109/MTDT.2006.11
Regular:

This presentation starts with DRAM market overview, demand side DRAM bit shipment, content per box trend, followed by the DRAM density migration and the technology migration trend, including... View More

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