IEEE - Institute of Electrical and Electronics Engineers, Inc. - Detecting Bilateral Symmetry in Perspective

2006 Conference on Computer Vision and Pattern Recognition Workshop

Author(s): H. Cornelius ; G. Loy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: New York, NY, USA, USA
Conference Date: 17 June 2006
Page(s): 191
ISBN (Paper): 0-7695-2646-2
DOI: 10.1109/CVPRW.2006.63
Regular:

A method is presented for efficiently detecting bilateral symmetry on planar surfaces under perspective projection. The method is able to detect local or global symmetries, locate symmetric... View More

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