IEEE - Institute of Electrical and Electronics Engineers, Inc. - Salient Contour Detection using a Global Contour Discontinuity Measurement

2006 Conference on Computer Vision and Pattern Recognition Workshop

Author(s): Hongzhi Wang ; J. Oliensis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: New York, NY, USA, USA
Conference Date: 17 June 2006
Page(s): 190
ISBN (Paper): 0-7695-2646-2
DOI: 10.1109/CVPRW.2006.183
Regular:

Salient contour grouping/detection is one of the major topics in perceptual organization exploring the true meanings for contours. Extending contour's discontinuity quality from low level... View More

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