IEEE - Institute of Electrical and Electronics Engineers, Inc. - Contour extrapolation using probabilistic cue combination

2006 Conference on Computer Vision and Pattern Recognition Workshop

Author(s): M. Singh ; J.M. Fulvio
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: New York, NY, USA, USA
Conference Date: 17 June 2006
Page(s): 188
ISBN (Paper): 0-7695-2646-2
DOI: 10.1109/CVPRW.2006.61
Regular:

A common approach to the problem of contour interpolation is based on the calculus of variations. The optimal interpolating contour is taken to be one that minimizes a given smoothness functional.... View More

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