IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multi-Scale Contour Extraction Based on Natural Image Statistics

2006 Conference on Computer Vision and Pattern Recognition Workshop

Author(s): F.J. Estrada ; J.H. Elder
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: New York, NY, USA, USA
Conference Date: 17 June 2006
Page(s): 183
ISBN (Paper): 0-7695-2646-2
DOI: 10.1109/CVPRW.2006.134
Regular:

Perceptual grouping of the complete boundaries of objects in natural images remains an unsolved problem in computer vision. The computational complexity of the problem and difficulties capturing... View More

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