IEEE - Institute of Electrical and Electronics Engineers, Inc. - Boundary Extraction in Natural Images Using Ultrametric Contour Maps

2006 Conference on Computer Vision and Pattern Recognition Workshop

Author(s): P. Arbelaez
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: New York, NY, USA, USA
Conference Date: 17 June 2006
Page(s): 182
ISBN (Paper): 0-7695-2646-2
DOI: 10.1109/CVPRW.2006.48
Regular:

This paper presents a low-level system for boundary extraction and segmentation of natural images and the evaluation of its performance. We study the problem in the framework of hierarchical... View More

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