IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multiscale Modeling and Constraints for Max-flow/Min-cut Problems in Computer Vision

2006 Conference on Computer Vision and Pattern Recognition Workshop

Author(s): M.W. Turek ; D. Freedman
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: New York, NY, USA, USA
Conference Date: 17 June 2006
Page(s): 180
ISBN (Paper): 0-7695-2646-2
DOI: 10.1109/CVPRW.2006.140
Regular:

Multiscale techniques have been used for many years in computer vision. Recently multiscale edges have received attention in spectral graph methods as an important perceptual cue. In this paper... View More

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