IEEE - Institute of Electrical and Electronics Engineers, Inc. - Model-Based Face De-Identification

2006 Conference on Computer Vision and Pattern Recognition Workshop

Author(s): R. Gross ; L. Sweeney ; F. de la Torre ; S. Baker
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: New York, NY, USA, USA
Conference Date: 17 June 2006
Page(s): 161
ISBN (Paper): 0-7695-2646-2
DOI: 10.1109/CVPRW.2006.125
Regular:

Advances in camera and computing equipment hardware in recent years have made it increasingly simple to capture and store extensive amounts of video data. This, among other things, creates ample... View More

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