IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust Statistical Estimation and Segmentation of Multiple Subspaces

2006 Conference on Computer Vision and Pattern Recognition Workshop

Author(s): A.Y. Yang ; S.R. Rao ; Yi Ma
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: New York, NY, USA, USA
Conference Date: 17 June 2006
Page(s): 99
ISBN (Paper): 0-7695-2646-2
DOI: 10.1109/CVPRW.2006.178
Regular:

We study the problem of estimating a mixed geometric model of multiple subspaces in the presence of a significant amount of outliers. The estimation of multiple subspaces is an important problem... View More

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