IEEE - Institute of Electrical and Electronics Engineers, Inc. - Statistically-Constrained High-Dimensional Warping Using Wavelet-Based Priors

2006 Conference on Computer Vision and Pattern Recognition Workshop

Author(s): Zhong Xue ; Dinggang Shen ; C. Davatzikos
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: New York, NY, USA, USA
Conference Date: 17 June 2006
Page(s): 71
ISBN (Paper): 0-7695-2646-2
DOI: 10.1109/CVPRW.2006.1
Regular:

In this paper, a Statistical Model of Deformation (SMD) that captures the statistical prior distribution of highdimensional deformations more accurately and effectively than conventional PCA-based... View More

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