IEEE - Institute of Electrical and Electronics Engineers, Inc. - New Validation Method for Establishing Correspondence Between Pairs of X-Ray Mammograms

2006 Conference on Computer Vision and Pattern Recognition Workshop

Author(s): J.H. Hipwell ; C. Tanner ; W.R. Crum ; D.J. Hawkes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: New York, NY, USA, USA
Conference Date: 17 June 2006
Page(s): 70
ISBN (Paper): 0-7695-2646-2
DOI: 10.1109/CVPRW.2006.143
Regular:

Establishing spatial correspondence between features visible in x-ray mammograms obtained at different times has great potential to aid assessment of change in the breast indicative of malignant... View More

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