IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic Image Quality Assessment with Application in Biometrics

2006 Conference on Computer Vision and Pattern Recognition Workshop

Author(s): H. Fronthaler ; K. Kollreider ; J. Bigun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: New York, NY, USA, USA
Conference Date: 17 June 2006
Page(s): 30
ISBN (Paper): 0-7695-2646-2
DOI: 10.1109/CVPRW.2006.36
Regular:

A method using local features to assess the quality of an image, with demonstration in biometrics, is proposed. Recently, image quality awareness has been found to increase recognition rates and... View More

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