IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Wavelet-Based Approach to Image Feature Stability Assessment

2006 Conference on Computer Vision and Pattern Recognition Workshop

Author(s): A. Robles-Kelly ; R. Goecke
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: New York, NY, USA, USA
Conference Date: 17 June 2006
Page(s): 25
ISBN (Paper): 0-7695-2646-2
DOI: 10.1109/CVPRW.2006.22
Regular:

In this paper, we present a novel method for assessing image-feature stability. The method hinges on applying the discrete wavelet transform to the image features under study throughout a number... View More

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