IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reinforcement Matching Using Region Context

2006 Conference on Computer Vision and Pattern Recognition Workshop

Author(s): Hongli Deng ; E.N. Mortensen ; L. Shapiro ; T.G. Dietterich
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: New York, NY, USA, USA
Conference Date: 17 June 2006
Page(s): 11
ISBN (Paper): 0-7695-2646-2
DOI: 10.1109/CVPRW.2006.169
Regular:

Local feature-based matching is robust to both clutter and occlusion. However, a primary shortcoming of local features is a deficiency of global information that can cause ambiguities in matching.... View More

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