IEEE - Institute of Electrical and Electronics Engineers, Inc. - In this work, we propose two translations: one from extended

Sixth International Conference on Application of Concurrency to System Design

Author(s): K. Altisen ; F. Cassez ; S. Tripakis
Sponsor(s): ICT Turku Oy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Turku, Finland
Conference Date: 28 June 2006
Page(s): 101 - 110
ISBN (Paper): 0-7695-2556-3
ISSN (Paper): 1550-4808
DOI: 10.1109/ACSD.2006.10
Regular:

We study the monitoring and fault-diagnosis problems for dense-time real-time systems, where observers (monitors and diagnosers) have access to digital rather than analog clocks. Analog clocks are... View More

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