IEEE - Institute of Electrical and Electronics Engineers, Inc. - A general data dependence analysis to nested loop using integer interval theory

Proceedings. 20th International Parallel and Distributed Processing Symposium

Author(s): Jing Zhou ; Guosun Zeng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Rhodes Island, Greece
Conference Date: 25 April 2006
ISBN (Paper): 1-4244-0054-6
DOI: 10.1109/IPDPS.2006.1639725
Regular:

Many dependence tests have been proposed for loop parallelization in the case of arrays with linear subscripts, but little work has been done on the arrays with non-linear subscripts, which... View More

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