IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault and intrusion tolerance of wireless sensor networks

Proceedings. 20th International Parallel and Distributed Processing Symposium

Author(s): Liang-min Wang ; Jian-feng Ma ; Chao Wang ; A.C. Kot
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Rhodes Island, Greece
Conference Date: 25 April 2006
ISBN (Paper): 1-4244-0054-6
DOI: 10.1109/IPDPS.2006.1639677
Regular:

The following three questions should be answered in developing new topology with more powerful ability to tolerate node-failure in wireless sensor network. First, what is node-failure tolerance of... View More

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