IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dynamic aspects for runtime fault determination and recovery

Proceedings. 20th International Parallel and Distributed Processing Symposium

Author(s): J. Manson ; J. Vitek ; S. Jagannathan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Rhodes Island, Greece
Conference Date: 25 April 2006
ISBN (Paper): 1-4244-0054-6
DOI: 10.1109/IPDPS.2006.1639576
Regular:

One of the most promising applications of aspect oriented programming (AOP) is the area of fault tolerance and recovery. In traditional programming languages, error handling code must be closely... View More

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