IEEE - Institute of Electrical and Electronics Engineers, Inc. - Condition monitoring benefits for cement manufacturing

2006 IEEE Cement Industry Technical Conference Record

Author(s): T. Milburn ; J. Price ; J. Sommers ; J. Francis ; L. Neuteboom
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Phoenix, AZ, USA
Conference Date: 9 April 2006
ISBN (Paper): 1-4244-0372-3
DOI: 10.1109/CITCON.2006.4667696
Regular:

Condition monitoring (CM) has been an integral part of the maintenance process at the Holcim (US) Inc. Devil's Slide Cement Plant since 2002. The use of CM at the plant has been successful at... View More

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