IEEE - Institute of Electrical and Electronics Engineers, Inc. - An optical tomography system for characterizing 3D shapes of particle aggregates

Proceedings of the 2006 IEEE Sensors Applications Symposium

Author(s): P. Giordano ; D. Barrot ; P. Mease ; K. Garrison ; S. Mandayam ; B. Sukumarani
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Houston, Texas,USA, USA
Conference Date: 7 February 2006
Page Count: 3
Page(s): 125 - 127
ISBN (Paper): 0-7803-9580-8
DOI: 10.1109/SAS.2006.1634252
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