IEEE - Institute of Electrical and Electronics Engineers, Inc. - Source Field Computation in NDT Applications

The 12th Biennial IEEE Conference on Electromagnetic Field Computation Digest Book

Author(s): T. Henneron ; Y. Le Menach ; J.-P. Ducreux ; O. Moreau ; J.-C. Verite ; S. Clenet ; F. Piriou
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Miami, FL, USA
Conference Date: 30 April 2006
Page Count: 1
Page(s): 428
ISBN (Paper): 1-4244-0320-0
DOI: 10.1109/CEFC-06.2006.1633218
Regular:

Numerical modeling of non-destructive testing (NDT) by eddy-currents has been evaluated as a support tool in the qualification process of testing devices. The encountered difficulties due to... View More

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