IEEE - Institute of Electrical and Electronics Engineers, Inc. - Penetrating Cracks Assessment in Metallic Plates

The 12th Biennial IEEE Conference on Electromagnetic Field Computation Digest Book

Author(s): P. Burrascano ; E. Cardelli ; A. Faba ; A. Pirani ; M. Ricci
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Miami, FL, USA
Conference Date: 30 April 2006
Page Count: 1
Page(s): 416
ISBN (Paper): 1-4244-0320-0
DOI: 10.1109/CEFC-06.2006.1633206
Regular:

In this work, we present a study about the sensibility of a suitable ECT (eddy current testing) system used for the prediction of depth and thickness of inner growing defects in metallic plates.... View More

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