IEEE - Institute of Electrical and Electronics Engineers, Inc. - Flaws Identification Using an Approximation Function and Artificial Neural Networks

The 12th Biennial IEEE Conference on Electromagnetic Field Computation Digest Book

Author(s): T. Chady ; P. Lopato
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Miami, FL, USA
Conference Date: 30 April 2006
Page Count: 1
Page(s): 311
ISBN (Paper): 1-4244-0320-0
DOI: 10.1109/CEFC-06.2006.1633101
Regular:

This paper presents flaws identification algorithm using artificial neural networks and an approximation function. An eddy current differential transducer was used to detect artificial flaws in... View More

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