IEEE - Institute of Electrical and Electronics Engineers, Inc. - Error analysis for high resolution topography with bi-static single-pass SAR interferometry

2006 IEEE Radar Conference

Author(s): R.J. Muellerschoen ; C.W. Chen ; S. Hensley ; E. Rodriguez
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Verona, NY, USA, USA
Conference Date: 24 April 2006
Page Count: 8
ISBN (Paper): 0-7803-9496-8
DOI: 10.1109/RADAR.2006.1631866
Regular:

We present a flow down error analysis from the radar system to topographic height errors for bi-static single pass SAR interferometry for a satellite tandem pair. Because of orbital dynamics the... View More

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