IEEE - Institute of Electrical and Electronics Engineers, Inc. - About the size effect in LHe-breakdown

ICDL'96. 12th International Conference on Conduction and Breakdown in Dielectric Liquids

Author(s): Gerhold, J. ; Hubmann, M. ; Telser, E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Roma, Italy, Italy
Conference Date: 15 July 1996
Page(s): 324 - 328
ISBN (Paper): 0-7803-3560-0
DOI: 10.1109/ICDL.1996.565499
Regular:

The breakdown strength of liquid helium (LHe)-filled gaps depends strongly on gap size, which is typical for a weak-link dominated breakdown. However, the theoretical basis as derived from Weibull... View More

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