IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dependence of finFET RF performance on fin width

2006 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems

Author(s): D. Lederer ; B. Parvais ; A. Mercha ; N. Collaert ; M. Jurczak ; J.-P. Raskin ; S. Decoutere
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: San Diego, CA, USA
Conference Date: 18 January 2006
Page Count: 4
ISBN (Paper): 0-7803-9472-0
DOI: 10.1109/SMIC.2005.1587887
Regular:

This work analyzes the radio frequency (RF) performance of 60-nm gate length finFETs, for which the DC behavior exhibits reduced SCE. The RF analysis is carried out as a function of the gate... View More

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