IEEE - Institute of Electrical and Electronics Engineers, Inc. - An on-chip diagnosis methodology for embedded cores with replaceable modules

Proceedings. 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems and Design

Author(s): R.C. Tekumalla
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hyderabad, India, India
Conference Date: 3 January 2006
ISBN (Paper): 0-7695-2502-4
ISSN (Paper): 1063-9667
DOI: 10.1109/VLSID.2006.45
Regular:

We propose a design for test and diagnosis architecture that simplifies the process of identifying failures within a failing sub-module, without explicitly identifying the faults responsible for... View More

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