IEEE - Institute of Electrical and Electronics Engineers, Inc. - A priori formal coverage analysis for protocol properties

Proceedings. 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems and Design

Author(s): P. Tiwari ; S. Biswas ; R.S. Mitra
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hyderabad, India, India
Conference Date: 3 January 2006
ISBN (Paper): 0-7695-2502-4
ISSN (Paper): 1063-9667
DOI: 10.1109/VLSID.2006.48
Regular:

Protocol compliance verification is a key component of the overall SOC verification process. Formal techniques have been applied to achieve high confidence in such verification, but the quality of... View More

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