IEEE - Institute of Electrical and Electronics Engineers, Inc. - On methods to improve location based logic diagnosis

Proceedings. 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems and Design

Author(s): Wei Zou ; Wu-Tung Cheng ; S.M. Reddy ; Huaxing Tang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hyderabad, India, India
Conference Date: 3 January 2006
ISBN (Paper): 0-7695-2502-4
ISSN (Paper): 1063-9667
DOI: 10.1109/VLSID.2006.123
Regular:

The general flow of location based logic diagnosis begins with finding a set of locations which can explain one or more single location at-a time (SLAT) failing patterns [Bartenstein, 2001], then... View More

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